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Exploiting bus level and bit level inactivity for preventing wire degradation due to electromigration

Citation:

M. Kayaalp, F. Koc, and O. Ergin, “Exploiting bus level and bit level inactivity for preventing wire degradation due to electromigration,” in Digital System Design (DSD), 2012 15th Euromicro Conference on, 2012, pp. 280–287.

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