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Improving the Soft Error Resilience of the Register Files Using SRAM Bitcells with Built-In Comparators

Citation:

M. Kayaalp, F. Koc, and O. Ergin, “Improving the Soft Error Resilience of the Register Files Using SRAM Bitcells with Built-In Comparators,” in Digital System Design (DSD), 2012 15th Euromicro Conference on, 2012, pp. 140–143.

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