VLSI Fault Tolerance


As the technology scales down to very deep submicron the vulnerability of integrated circuits to soft errors increase remarkably. Soft errors caused by high energy particles striking the substrate of integrated circuits increase as the chip density, clock frequency, and voltage supply change due to technology development. Therefore, fault-tolerance mechanisms become more essential in both combinational and sequential circuits. The goal for fault-tolerant designs is achieving a reliable system by detecting soft errors while reducing the area and power consumption.

Relevant publications: